Rheological engineering of perovskite suspension toward high-resolution X-ray flat-panel detector

Zihao Song, Xinyuan Du, Xin He, Hanqi Wang, Zhiqiang Liu, Haodi Wu, Hongde Luo, Libo Jin, Ling Xu, Zhiping Zheng, Guangda Niu () and Jiang Tang
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Zihao Song: Huazhong University of Science and Technology (HUST)
Xinyuan Du: Huazhong University of Science and Technology (HUST)
Xin He: Huazhong University of Science and Technology (HUST)
Hanqi Wang: Huazhong University of Science and Technology (HUST)
Zhiqiang Liu: Huazhong University of Science and Technology (HUST)
Haodi Wu: Huazhong University of Science and Technology (HUST)
Hongde Luo: iRay Technology Company Limited
Libo Jin: iRay Technology Company Limited
Ling Xu: Huazhong University of Science and Technology (HUST)
Zhiping Zheng: Huazhong University of Science and Technology (HUST)
Guangda Niu: Huazhong University of Science and Technology (HUST)
Jiang Tang: Huazhong University of Science and Technology (HUST)

Nature Communications, 2023, vol. 14, issue 1, 1-8

Abstract: Abstract Solution-processed polycrystalline perovskite film is promising for the next generation X-ray imaging. However, the spatial resolution of current perovskite X-ray panel detectors is far lower than the theoretical limit. Herein we find that the pixel level non-uniformity, also known as fixed pattern noise, is the chief culprit affecting the signal-to-noise ratio and reducing the resolution of perovskite detectors. We report a synergistic strategy of rheological engineering the perovskite suspensions to achieve X-ray flat panel detectors with pixel-level high uniformity and near-to-limit spatial resolution. Our approach includes the addition of methylammonium iodide and polyacrylonitrile to the perovskite suspension, to synergistically enhance the flowability and particle stability of the oversaturated solution. The obtained suspension perfectly suits for the blade-coating process, avoiding the uneven distribution of solutes and particles within perovskite films. The assembled perovskite panel detector exhibits greatly improved fixed pattern noise value (1.39%), high sensitivity (2.24 × 104 μC Gyair−1 cm−2), low detection limit (28.57 nGyair·s−1) as well as good working stability, close to the performance of single crystal detectors. Moreover, the detector achieves a near-to-limit resolution of 0.51 lp/pix.

Date: 2023
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DOI: 10.1038/s41467-023-42616-5

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