Direct observation of strong surface reconstruction in partially reduced nickelate films

Chao Yang (), Rebecca Pons, Wilfried Sigle, Hongguang Wang, Eva Benckiser, Gennady Logvenov, Bernhard Keimer and Peter A. Aken
Additional contact information
Chao Yang: Max Planck Institute for Solid State Research
Rebecca Pons: Max Planck Institute for Solid State Research
Wilfried Sigle: Max Planck Institute for Solid State Research
Hongguang Wang: Max Planck Institute for Solid State Research
Eva Benckiser: Max Planck Institute for Solid State Research
Gennady Logvenov: Max Planck Institute for Solid State Research
Bernhard Keimer: Max Planck Institute for Solid State Research
Peter A. Aken: Max Planck Institute for Solid State Research

Nature Communications, 2024, vol. 15, issue 1, 1-8

Abstract: Abstract The polarity of a surface can affect the electronic and structural properties of oxide thin films through electrostatic effects. Understanding the mechanism behind these effects requires knowledge of the atomic structure and electrostatic characteristics at the surface. In this study, we use annular bright-field imaging to investigate the surface structure of a Pr0.8Sr0.2NiO2+x (0

Date: 2024
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DOI: 10.1038/s41467-023-44616-x

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