Dynamic X-ray imaging with screen-printed perovskite CMOS array

Yanliang Liu, Chaosong Gao, Dong Li, Xin Zhang, Jiongtao Zhu, Meng Wu, Wenjun Liu, Tongyu Shi, Xingchen He, Jiahong Wang, Hao Huang, Zonghai Sheng, Dong Liang, Xue-Feng Yu (), Hairong Zheng (), Xiangming Sun () and Yongshuai Ge ()
Additional contact information
Yanliang Liu: Chinese Academy of Sciences
Chaosong Gao: Central China Normal University
Dong Li: Chinese Academy of Sciences
Xin Zhang: Chinese Academy of Sciences
Jiongtao Zhu: Chinese Academy of Sciences
Meng Wu: Central China Normal University
Wenjun Liu: Chinese Academy of Sciences
Tongyu Shi: Chinese Academy of Sciences
Xingchen He: Chinese Academy of Sciences
Jiahong Wang: Chinese Academy of Sciences
Hao Huang: Chinese Academy of Sciences
Zonghai Sheng: Chinese Academy of Sciences
Dong Liang: Chinese Academy of Sciences
Xue-Feng Yu: Chinese Academy of Sciences
Hairong Zheng: Chinese Academy of Sciences
Xiangming Sun: Central China Normal University
Yongshuai Ge: Chinese Academy of Sciences

Nature Communications, 2024, vol. 15, issue 1, 1-7

Abstract: Abstract High performance X-ray detector with ultra-high spatial and temporal resolution are crucial for biomedical imaging. This study reports a dynamic direct-conversion CMOS X-ray detector assembled with screen-printed CsPbBr3, whose mobility-lifetime product is 5.2 × 10−4 cm2 V–1 and X-ray sensitivity is 1.6 × 104 µC Gyair–1 cm–2. Samples larger than 5 cm $$\times$$ × 10 cm can be rapidly imaged by scanning this detector at a speed of 300 frames per second along the vertical and horizontal directions. In comparison to traditional indirect-conversion CMOS X-ray detector, this perovskite CMOS detector offers high spatial resolution (5.0 lp mm−1) X-ray radiographic imaging capability at low radiation dose (260 nGy). Moreover, 3D tomographic images of a biological specimen are also successfully reconstructed. These results highlight the perovskite CMOS detector’s potential in high-resolution, large-area, low-dose dynamic biomedical X-ray and CT imaging, as well as in non-destructive X-ray testing and security scanning.

Date: 2024
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DOI: 10.1038/s41467-024-45871-2

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