Si/SiGe QuBus for single electron information-processing devices with memory and micron-scale connectivity function
Ran Xue,
Max Beer,
Inga Seidler,
Simon Humpohl,
Jhih-Sian Tu,
Stefan Trellenkamp,
Tom Struck,
Hendrik Bluhm and
Lars R. Schreiber ()
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Ran Xue: Forschungszentrum Jülich GmbH and RWTH Aachen University
Max Beer: Forschungszentrum Jülich GmbH and RWTH Aachen University
Inga Seidler: Forschungszentrum Jülich GmbH and RWTH Aachen University
Simon Humpohl: Forschungszentrum Jülich GmbH and RWTH Aachen University
Jhih-Sian Tu: Forschungszentrum Jülich
Stefan Trellenkamp: Forschungszentrum Jülich
Tom Struck: Forschungszentrum Jülich GmbH and RWTH Aachen University
Hendrik Bluhm: Forschungszentrum Jülich GmbH and RWTH Aachen University
Lars R. Schreiber: Forschungszentrum Jülich GmbH and RWTH Aachen University
Nature Communications, 2024, vol. 15, issue 1, 1-7
Abstract:
Abstract The connectivity within single carrier information-processing devices requires transport and storage of single charge quanta. Single electrons have been adiabatically transported while confined to a moving quantum dot in short, all-electrical Si/SiGe shuttle device, called quantum bus (QuBus). Here we show a QuBus spanning a length of 10 μm and operated by only six simply-tunable voltage pulses. We introduce a characterization method, called shuttle-tomography, to benchmark the potential imperfections and local shuttle-fidelity of the QuBus. The fidelity of the single-electron shuttle across the full device and back (a total distance of 19 μm) is (99.7 ± 0.3) %. Using the QuBus, we position and detect up to 34 electrons and initialize a register of 34 quantum dots with arbitrarily chosen patterns of zero and single-electrons. The simple operation signals, compatibility with industry fabrication and low spin-environment-interaction in 28Si/SiGe, promises long-range spin-conserving transport of spin qubits for quantum connectivity in quantum computing architectures.
Date: 2024
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Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:15:y:2024:i:1:d:10.1038_s41467-024-46519-x
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DOI: 10.1038/s41467-024-46519-x
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