Experimental demonstration of an on-chip p-bit core based on stochastic magnetic tunnel junctions and 2D MoS2 transistors

John Daniel (), Zheng Sun, Xuejian Zhang, Yuanqiu Tan, Neil Dilley, Zhihong Chen and Joerg Appenzeller ()
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John Daniel: Purdue University
Zheng Sun: Purdue University
Xuejian Zhang: Purdue University
Yuanqiu Tan: Purdue University
Neil Dilley: Purdue University
Zhihong Chen: Purdue University
Joerg Appenzeller: Purdue University

Nature Communications, 2024, vol. 15, issue 1, 1-11

Abstract: Abstract Probabilistic computing is a computing scheme that offers a more efficient approach than conventional complementary metal-oxide–semiconductor (CMOS)-based logic in a variety of applications ranging from optimization to Bayesian inference, and invertible Boolean logic. The probabilistic bit (or p-bit, the base unit of probabilistic computing) is a naturally fluctuating entity that requires tunable stochasticity; by coupling low-barrier stochastic magnetic tunnel junctions (MTJs) with a transistor circuit, a compact implementation is achieved. In this work, by combining stochastic MTJs with 2D-MoS2 field-effect transistors (FETs), we demonstrate an on-chip realization of a p-bit building block displaying voltage-controllable stochasticity. Supported by circuit simulations, we analyze the three transistor-one magnetic tunnel junction (3T-1MTJ) p-bit design, evaluating how the characteristics of each component influence the overall p-bit output. While the current approach has not reached the level of maturity required to compete with CMOS-compatible MTJ technology, the design rules presented in this work are valuable for future experimental implementations of scaled on-chip p-bit networks with reduced footprint.

Date: 2024
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DOI: 10.1038/s41467-024-48152-0

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