Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography

Guanxing Li, Ming Xu, Wen-Qi Tang, Ying Liu, Cailing Chen, Daliang Zhang, Lingmei Liu, Shoucong Ning (), Hui Zhang (), Zhi-Yuan Gu, Zhiping Lai, David A. Muller and Yu Han ()
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Guanxing Li: King Abdullah University of Science and Technology (KAUST)
Ming Xu: Nanjing Normal University
Wen-Qi Tang: Nanjing Normal University
Ying Liu: Chongqing University
Cailing Chen: King Abdullah University of Science and Technology (KAUST)
Daliang Zhang: Chongqing University
Lingmei Liu: Chongqing University
Shoucong Ning: University of Science and Technology of China
Hui Zhang: South China University of Technology
Zhi-Yuan Gu: Nanjing Normal University
Zhiping Lai: King Abdullah University of Science and Technology (KAUST)
David A. Muller: Cornell University
Yu Han: South China University of Technology

Nature Communications, 2025, vol. 16, issue 1, 1-8

Abstract: Abstract Electron ptychography, recognized as an ideal technique for low-dose imaging, consistently achieves deep sub-angstrom resolution at electron doses of several thousand electrons per square angstrom (e−/Å2) or higher. Despite its proven efficacy, the application of electron ptychography at even lower doses—necessary for materials highly sensitive to electron beams—raises questions regarding its feasibility and the attainable resolution under such stringent conditions. Herein, we demonstrate the implementation of near-atomic-resolution ( ~ 2 Å) electron ptychography reconstruction at electron doses as low as ~100 e−/Å2, for metal-organic frameworks (MOFs), which are known for their extreme sensitivity. The reconstructed images clearly resolve organic linkers, metal clusters, and even atomic columns within these clusters, while unravelling various local structural features in MOFs, including missing linkers, extra clusters, and surface termination modes. By combining the findings from simulations and experiments, we have identified that employing a small convergence semi-angle during data acquisition is crucial for effective iterative ptychographic reconstruction under such low-dose conditions. This important insight advances our understanding of the rapidly evolving electron ptychography technique and provides a novel approach to high-resolution imaging of various sensitive materials.

Date: 2025
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DOI: 10.1038/s41467-025-56215-z

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