Deviatoric stress-induced transition of self-trapped exciton emissions

Chaofan Lv, Xigui Yang (), Yanran Wu, Feihu Lei, Yachuan Liang, Dongwen Yang, Laizhi Sui, Jinxu Qin, Qilong Wu, Shoulong Lai, Hang Liu, Jinhao Zang, Shaobo Cheng, Kaikai Liu () and Chongxin Shan ()
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Chaofan Lv: Chinese Academy of Sciences
Xigui Yang: Zhengzhou University
Yanran Wu: Zhengzhou University
Feihu Lei: Zhengzhou University
Yachuan Liang: Zhengzhou University
Dongwen Yang: Zhengzhou University
Laizhi Sui: Chinese Academy of Sciences
Jinxu Qin: Zhengzhou University
Qilong Wu: Zhengzhou University
Shoulong Lai: Zhengzhou University
Hang Liu: Zhengzhou University
Jinhao Zang: Zhengzhou University
Shaobo Cheng: Zhengzhou University
Kaikai Liu: Zhengzhou University
Chongxin Shan: Zhengzhou University

Nature Communications, 2025, vol. 16, issue 1, 1-12

Abstract: Abstract Self-trapped exciton (STE) emissions, featured by broad spectral band and minimal self-absorption, have garnered considerable attention for advanced lighting and imaging applications. However, developing strategies to facilitate multiple STE states, modulate the emission energy and extend the emission range remains a great challenge. Here, we introduce deviatoric stress to induce another intrinsic STE state (STE-2) and enable transitions between the intrinsic STE state (STE-1) and STE-2 in pyramidal ZnO nanocrystals. This approach results in a remarkable shift in emission energy, from yellow-green (2.34 eV) to deep-blue (2.88 eV). Combined in-situ stress monitoring and optical experiments show that the STE-2 state originates from a potential well generated by the deviatoric yield deformation of the pyramidal crystals under deviatoric stress. Spectroscopic and dynamical characterizations of the two STE emissions reveal a transition process in the carrier’s relaxation pathway from STE-2 to STE-1, and conversely at much higher pressures. These findings demonstrate that deviatoric stress serves as a robust tool for modulating STE emissions and provide new insights into the evolution of carrier dynamics of STE emissions.

Date: 2025
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DOI: 10.1038/s41467-025-57026-y

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