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Large-scale alkali-assisted growth of monolayer and bilayer WSe2 with a low defect density

Sui-An Chou, Chen Chang, Bo-Hong Wu, Chih-Piao Chuu, Pai-Chia Kuo, Liang-Hsuan Pan, Kai-Chun Huang, Man-Hong Lai, Yi-Feng Chen, Che-Lun Lee, Hao-Yu Chen, Jessie Shiue, Yu-Ming Chang, Ming-Yang Li, Ya-Ping Chiu, Chun-Wei Chen () and Po-Hsun Ho ()
Additional contact information
Sui-An Chou: Taiwan Semiconductor Manufacturing Company
Chen Chang: National Taiwan University
Bo-Hong Wu: National Taiwan University
Chih-Piao Chuu: Taiwan Semiconductor Manufacturing Company
Pai-Chia Kuo: Academia Sinica
Liang-Hsuan Pan: National Taiwan University
Kai-Chun Huang: National Taiwan University
Man-Hong Lai: National Taiwan University
Yi-Feng Chen: National Taiwan University
Che-Lun Lee: National Taiwan University
Hao-Yu Chen: National Taiwan University
Jessie Shiue: Academia Sinica
Yu-Ming Chang: National Taiwan University
Ming-Yang Li: Taiwan Semiconductor Manufacturing Company
Ya-Ping Chiu: National Taiwan University
Chun-Wei Chen: National Taiwan University
Po-Hsun Ho: Taiwan Semiconductor Manufacturing Company

Nature Communications, 2025, vol. 16, issue 1, 1-8

Abstract: Abstract The development of p-type WSe2 transistors has lagged behind n-type MoS2 because of challenges in growing high-quality, large-area WSe2 films. This study employs an alkali-assisted CVD (AACVD) method by using KOH to enhance nucleation on sapphire substrates, effectively promoting monolayer growth on c-plane sapphire and enabling controlled bilayer seeding on miscut surfaces with artificial steps. With AACVD, we achieve 2-inch monolayer and centimeter-scale bilayer WSe2 films with defect densities as low as 1.6 × 1012 cm−2 (monolayer) and 1.8 × 1012 cm−2 (bilayer), comparable to exfoliated WSe2. Bilayer WSe2 transistors exhibit hole/electron mobilities of 119/34 cm²/Vs, while monolayers achieve 105/22 cm²/Vs with suitable metal contacts. Additionally, bilayer WSe2 demonstrates lower contact resistance for both n-type and p-type transistors, making it highly promising for future high-performance electronic applications.

Date: 2025
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Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:16:y:2025:i:1:d:10.1038_s41467-025-57986-1

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DOI: 10.1038/s41467-025-57986-1

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