Yttrium oxide engineered substrate enables improved durability for perovskite solar cells
Haibing Wang,
Yansong Ge,
Wenlong Shao,
Xingyu Xiong,
Guang Li,
Nengxu Li,
Xuzhi Hu,
Guoyi Chen,
Kailian Dong,
Wei Ai,
Zixi Yu,
Zhimiao Zheng,
Chen Wang,
Fang Yao,
Xiaojuan Cao,
Songzhan Li,
Jianwei Zhao,
Weijun Ke,
Chen Tao (),
Yi Hou (),
Annamaria Petrozza () and
Guojia Fang ()
Additional contact information
Haibing Wang: Wuhan Textile University
Yansong Ge: Wuhan University
Wenlong Shao: Shanghai Institute of Space Power-Sources
Xingyu Xiong: South China University of Technology
Guang Li: Wuhan University
Nengxu Li: National University of Singapore
Xuzhi Hu: Wuhan Textile University
Guoyi Chen: Wuhan University
Kailian Dong: Wuhan University
Wei Ai: Wuhan University
Zixi Yu: Wuhan University
Zhimiao Zheng: Wuhan University
Chen Wang: Wuhan Textile University
Fang Yao: Wuhan Textile University
Xiaojuan Cao: Wuhan Textile University
Songzhan Li: Wuhan Textile University
Jianwei Zhao: Ltd
Weijun Ke: Wuhan University
Chen Tao: Wuhan Textile University
Yi Hou: National University of Singapore
Annamaria Petrozza: Istituto Italiano di Tecnologia
Guojia Fang: Wuhan Textile University
Nature Communications, 2025, vol. 16, issue 1, 1-11
Abstract:
Abstract Transparent conductive oxides (TCOs)—foundation of perovskite solar cells (PSCs)—have long been assumed to be stable, and thus their impact on device longevity is frequently overlooked. Herein, we unveil that fluorine doped tin oxide (FTO) suffers from instability under operational stress, exacerbating PSC stability issue. To address this issue, we propose a universal interface engineering strategy employing a scalable thermal evaporation followed by natural oxidation to form an atomically bonded yttrium oxide (Y2O3) to strengthen structural stability of FTO. Evaporated yttrium effectively anchors a portion of lattice oxygen within FTO, preventing elemental dissociation. Moreover, the formed Y2O3 featured conformal deposition on rough FTO increases the interfacial adhesion energy, establishing a robust barrier against ion diffusion and carrier nonradiative recombination loss. This approach fortifies the structural integrity of the PSC, leading to dramatically improved operational stability. Unencapsulated devices exhibit negligible performance loss after 1,200 h of continuous illumination. Notably, we achieve power conversion efficiencies of 26.48% (certified at 26.12%) in regular (n–i–p) architectures, 26.34% in inverted (p–i–n) configurations, and 28.47% in tandem structures–among one of the highest reported in their respective categories–underscoring its strong generality and potential for commercialization.
Date: 2025
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DOI: 10.1038/s41467-025-64548-y
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