Near-field examination of perovskite-based superlenses and superlens-enhanced probe-object coupling

S.C. Kehr (), Y.M. Liu, L.W. Martin, P. Yu, M. Gajek, S.-Y. Yang, C.-H. Yang, M.T. Wenzel, R. Jacob, H.-G. von Ribbeck, M. Helm, X. Zhang, L.M. Eng and R. Ramesh
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S.C. Kehr: Lawrence Berkeley National Laboratory
Y.M. Liu: NSF Nanoscale Science and Engineering Center, University of California
L.W. Martin: Lawrence Berkeley National Laboratory
P. Yu: University of California
M. Gajek: University of California
S.-Y. Yang: University of California
C.-H. Yang: University of California
M.T. Wenzel: Institute of Applied Physics, Technische Universität Dresden
R. Jacob: Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf
H.-G. von Ribbeck: Institute of Applied Physics, Technische Universität Dresden
M. Helm: Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf
X. Zhang: Lawrence Berkeley National Laboratory
L.M. Eng: Institute of Applied Physics, Technische Universität Dresden
R. Ramesh: Lawrence Berkeley National Laboratory

Nature Communications, 2011, vol. 2, issue 1, 1-9

Abstract: Abstract A planar slab of negative-index material works as a superlens with sub-diffraction-limited resolution, as propagating waves are focused and, moreover, evanescent waves are reconstructed in the image plane. Here we demonstrate a superlens for electric evanescent fields with low losses using perovskites in the mid-infrared regime. The combination of near-field microscopy with a tunable free-electron laser allows us to address precisely the polariton modes, which are critical for super-resolution imaging. We spectrally study the lateral and vertical distributions of evanescent waves around the image plane of such a lens, and achieve imaging resolution of λ/14 at the superlensing wavelength. Interestingly, at certain distances between the probe and sample surface, we observe a maximum of these evanescent fields. Comparisons with numerical simulations indicate that this maximum originates from an enhanced coupling between probe and object, which might be applicable for multifunctional circuits, infrared spectroscopy and thermal sensors.

Date: 2011
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DOI: 10.1038/ncomms1249

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