Imaging local electronic corrugations and doped regions in graphene

Brian J. Schultz, Christopher J. Patridge, Vincent Lee, Cherno Jaye, Patrick S. Lysaght, Casey Smith, Joel Barnett, Daniel A. Fischer, David Prendergast () and Sarbajit Banerjee ()
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Brian J. Schultz: University at Buffalo, State University of New York
Christopher J. Patridge: University at Buffalo, State University of New York
Vincent Lee: University at Buffalo, State University of New York
Cherno Jaye: Material Measurement Laboratory, National Institute of Standards and Technology
Patrick S. Lysaght: SEMATECH
Casey Smith: SEMATECH
Joel Barnett: SEMATECH
Daniel A. Fischer: Material Measurement Laboratory, National Institute of Standards and Technology
David Prendergast: Molecular Foundry, Lawrence Berkeley National Laboratory
Sarbajit Banerjee: University at Buffalo, State University of New York

Nature Communications, 2011, vol. 2, issue 1, 1-8

Abstract: Abstract Electronic structure heterogeneities are ubiquitous in two-dimensional graphene and profoundly impact the transport properties of this material. Here we show the mapping of discrete electronic domains within a single graphene sheet using scanning transmission X-ray microscopy in conjunction with ab initio density functional theory calculations. Scanning transmission X-ray microscopy imaging provides a wealth of detail regarding the extent to which the unoccupied levels of graphene are modified by corrugation, doping and adventitious impurities, as a result of synthesis and processing. Local electronic corrugations, visualized as distortions of the π*cloud, have been imaged alongside inhomogeneously doped regions characterized by distinctive spectral signatures of altered unoccupied density of states. The combination of density functional theory calculations, scanning transmission X-ray microscopy imaging, and in situ near-edge X-ray absorption fine structure spectroscopy experiments also provide resolution of a longstanding debate in the literature regarding the spectral assignments of pre-edge and interlayer states.

Date: 2011
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DOI: 10.1038/ncomms1376

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