Single-shot pulse duration monitor for extreme ultraviolet and X-ray free-electron lasers

R. Riedel (), A. Al-Shemmary, M. Gensch, T. Golz, M. Harmand, N. Medvedev, M. J. Prandolini, K. Sokolowski-Tinten, S. Toleikis, U. Wegner, B. Ziaja, N. Stojanovic () and F. Tavella
Additional contact information
R. Riedel: Universität Hamburg, Luruper Chaussee 149
A. Al-Shemmary: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
M. Gensch: Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstrasse 400
T. Golz: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
M. Harmand: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
N. Medvedev: Center for Free-Electron Laser Science/DESY Notkestraße 85
M. J. Prandolini: Helmholtz-Institut Jena, Max-Wien-Platz 1
K. Sokolowski-Tinten: Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen
S. Toleikis: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
U. Wegner: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
B. Ziaja: Center for Free-Electron Laser Science/DESY Notkestraße 85
N. Stojanovic: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
F. Tavella: Helmholtz-Institut Jena, Max-Wien-Platz 1

Nature Communications, 2013, vol. 4, issue 1, 1-7

Abstract: Abstract The resolution of ultrafast studies performed at extreme ultraviolet and X-ray free-electron lasers is still limited by shot-to-shot variations of the temporal pulse characteristics. Here we show a versatile single-shot temporal diagnostic tool that allows the determination of the extreme ultraviolet pulse duration and the relative arrival time with respect to an external pump-probe laser pulse. This method is based on time-resolved optical probing of the transient reflectivity change due to linear absorption of the extreme ultraviolet pulse within a solid material. In this work, we present measurements performed at the FLASH free-electron laser. We determine the pulse duration at two distinct wavelengths, yielding (184±14) fs at 41.5 nm and (21±19) fs at 5.5 nm. Furthermore, we demonstrate the feasibility to operate the tool as an online diagnostic by using a 20-nm-thin Si3N4 membrane as target. Our results are supported by detailed numerical and analytical investigations.

Date: 2013
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DOI: 10.1038/ncomms2754

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