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Quantum metrology with parametric amplifier-based photon correlation interferometers

F. Hudelist, Jia Kong, Cunjin Liu, Jietai Jing, Z.Y. Ou () and Weiping Zhang ()
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F. Hudelist: Quantum Institute for Light and Atoms, State Key Laboratory of Precision Spectroscopy, East China Normal University
Jia Kong: Quantum Institute for Light and Atoms, State Key Laboratory of Precision Spectroscopy, East China Normal University
Cunjin Liu: Quantum Institute for Light and Atoms, State Key Laboratory of Precision Spectroscopy, East China Normal University
Jietai Jing: Quantum Institute for Light and Atoms, State Key Laboratory of Precision Spectroscopy, East China Normal University
Z.Y. Ou: Quantum Institute for Light and Atoms, State Key Laboratory of Precision Spectroscopy, East China Normal University
Weiping Zhang: Quantum Institute for Light and Atoms, State Key Laboratory of Precision Spectroscopy, East China Normal University

Nature Communications, 2014, vol. 5, issue 1, 1-6

Abstract: Abstract Conventional interferometers usually utilize beam splitters for wave splitting and recombination. These interferometers are widely used for precision measurement. Their sensitivity for phase measurement is limited by the shot noise, which can be suppressed with squeezed states of light. Here we study a new type of interferometer in which the beam splitting and recombination elements are parametric amplifiers. We observe an improvement of 4.1±0.3 dB in signal-to-noise ratio compared with a conventional interferometer under the same operating condition, which is a 1.6-fold enhancement in rms phase measurement sensitivity beyond the shot noise limit. The improvement is due to signal enhancement. Combined with the squeezed state technique for shot noise suppression, this interferometer promises further improvement in sensitivity. Furthermore, because nonlinear processes are involved in this interferometer, we can couple a variety of different waves and form new types of hybrid interferometers, opening a door for many applications in metrology.

Date: 2014
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DOI: 10.1038/ncomms4049

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