Few-femtosecond time-resolved measurements of X-ray free-electron lasers

C. Behrens, F.-J. Decker, Y. Ding (), V. A. Dolgashev, J. Frisch, Z. Huang, P. Krejcik (), H. Loos, A. Lutman, T. J. Maxwell, J. Turner, J. Wang, M.-H. Wang, J. Welch and J. Wu
Additional contact information
C. Behrens: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
F.-J. Decker: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
Y. Ding: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
V. A. Dolgashev: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
J. Frisch: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
Z. Huang: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
P. Krejcik: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
H. Loos: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
A. Lutman: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
T. J. Maxwell: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
J. Turner: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
J. Wang: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
M.-H. Wang: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
J. Welch: SLAC National Accelerator Laboratory, 2575 Sand Hill Road
J. Wu: SLAC National Accelerator Laboratory, 2575 Sand Hill Road

Nature Communications, 2014, vol. 5, issue 1, 1-7

Abstract: Abstract X-ray free-electron lasers, with pulse durations ranging from a few to several hundred femtoseconds, are uniquely suited for studying atomic, molecular, chemical and biological systems. Characterizing the temporal profiles of these femtosecond X-ray pulses that vary from shot to shot is not only challenging but also important for data interpretation. Here we report the time-resolved measurements of X-ray free-electron lasers by using an X-band radiofrequency transverse deflector at the Linac Coherent Light Source. We demonstrate this method to be a simple, non-invasive technique with a large dynamic range for single-shot electron and X-ray temporal characterization. A resolution of less than 1 fs root mean square has been achieved for soft X-ray pulses. The lasing evolution along the undulator has been studied with the electron trapping being observed as the X-ray peak power approaches 100 GW.

Date: 2014
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DOI: 10.1038/ncomms4762

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