Probing charge screening dynamics and electrochemical processes at the solid–liquid interface with electrochemical force microscopy
Liam Collins,
Stephen Jesse,
Jason I. Kilpatrick,
Alexander Tselev,
Oleksandr Varenyk,
M. Baris Okatan,
Stefan A. L. Weber,
Amit Kumar,
Nina Balke,
Sergei V. Kalinin and
Brian J. Rodriguez ()
Additional contact information
Liam Collins: School of Physics, University College Dublin, Belfield
Stephen Jesse: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge
Jason I. Kilpatrick: Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield
Alexander Tselev: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge
Oleksandr Varenyk: Taras Shevchenko National University of Kyiv, Radiophysical Faculty, 4g, pr. Akademika Hlushkova
M. Baris Okatan: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge
Stefan A. L. Weber: Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield
Amit Kumar: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge
Nina Balke: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge
Sergei V. Kalinin: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge
Brian J. Rodriguez: School of Physics, University College Dublin, Belfield
Nature Communications, 2014, vol. 5, issue 1, 1-8
Abstract:
Abstract The presence of mobile ions complicates the implementation of voltage-modulated scanning probe microscopy techniques such as Kelvin probe force microscopy (KPFM). Overcoming this technical hurdle, however, provides a unique opportunity to probe ion dynamics and electrochemical processes in liquid environments and the possibility to unravel the underlying mechanisms behind important processes at the solid–liquid interface, including adsorption, electron transfer and electrocatalysis. Here we describe the development and implementation of electrochemical force microscopy (EcFM) to probe local bias- and time-resolved ion dynamics and electrochemical processes at the solid–liquid interface. Using EcFM, we demonstrate contact potential difference measurements, consistent with the principles of open-loop KPFM operation. We also demonstrate that EcFM can be used to investigate charge screening mechanisms and electrochemical reactions in the probe–sample junction. We further establish EcFM as a force-based imaging mode, allowing visualization of the spatial variability of sample-dependent local electrochemical properties.
Date: 2014
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Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:5:y:2014:i:1:d:10.1038_ncomms4871
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DOI: 10.1038/ncomms4871
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