Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts

Andrew B. Yankovich, Benjamin Berkels, W. Dahmen, P. Binev, S. I. Sanchez, S. A. Bradley, Ao Li, Izabela Szlufarska and Paul M. Voyles ()
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Andrew B. Yankovich: University of Wisconsin—Madison
Benjamin Berkels: Interdisciplinary Mathematics Institute, University of South Carolina
W. Dahmen: Interdisciplinary Mathematics Institute, University of South Carolina
P. Binev: Interdisciplinary Mathematics Institute, University of South Carolina
S. I. Sanchez: UOP LLC a Honeywell Company
S. A. Bradley: UOP LLC a Honeywell Company
Ao Li: University of Wisconsin—Madison
Izabela Szlufarska: University of Wisconsin—Madison
Paul M. Voyles: University of Wisconsin—Madison

Nature Communications, 2014, vol. 5, issue 1, 1-7

Abstract: Abstract Measuring picometre-scale shifts in the positions of individual atoms in materials provides new insight into the structure of surfaces, defects and interfaces that influence a broad variety of materials’ behaviour. Here we demonstrate sub-picometre precision measurements of atom positions in aberration-corrected Z-contrast scanning transmission electron microscopy images based on the non-rigid registration and averaging of an image series. Non-rigid registration achieves five to seven times better precision than previous methods. Non-rigidly registered images of a silica-supported platinum nanocatalyst show pm-scale contraction of atoms at a ( )/( ) corner towards the particle centre and expansion of a flat ( ) facet. Sub-picometre precision and standardless atom counting with

Date: 2014
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DOI: 10.1038/ncomms5155

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