Correction: Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization

H. Simons, A. King, W. Ludwig, C. Detlefs, W. Pantleon, S. Schmidt, F. Stöhr, I. Snigireva, A. Snigirev and H. F. Poulsen

Nature Communications, 2015, vol. 6, issue 1, 1-1

Abstract: Nature Communications 6: Article number: 6098 (2015); Published: 14 January 2015; Updated: 5 March 2015 The authors inadvertently omitted Frederik Stöhr, who developed the silicon condenser lens used for the acquisition of data presented in this Article, from the author list. This has now been corrected in both the PDF and HTML versions of the Article.

Date: 2015
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DOI: 10.1038/ncomms7612

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