Magnetic fingerprint of individual Fe4 molecular magnets under compression by a scanning tunnelling microscope

Jacob A.J. Burgess (), Luigi Malavolti, Valeria Lanzilotto, Matteo Mannini, Shichao Yan, Silviya Ninova, Federico Totti, Steffen Rolf-Pissarczyk, Andrea Cornia, Roberta Sessoli and Sebastian Loth ()
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Jacob A.J. Burgess: Max Planck Institute for the Structure and Dynamics of Matter
Luigi Malavolti: Max Planck Institute for the Structure and Dynamics of Matter
Valeria Lanzilotto: University of Florence & INSTM RU of Florence
Matteo Mannini: University of Florence & INSTM RU of Florence
Shichao Yan: Max Planck Institute for the Structure and Dynamics of Matter
Silviya Ninova: University of Florence & INSTM RU of Florence
Federico Totti: University of Florence & INSTM RU of Florence
Steffen Rolf-Pissarczyk: Max Planck Institute for the Structure and Dynamics of Matter
Andrea Cornia: University of Modena and Reggio Emilia & INSTM RU of Modena and Reggio Emilia
Roberta Sessoli: University of Florence & INSTM RU of Florence
Sebastian Loth: Max Planck Institute for the Structure and Dynamics of Matter

Nature Communications, 2015, vol. 6, issue 1, 1-7

Abstract: Abstract Single-molecule magnets (SMMs) present a promising avenue to develop spintronic technologies. Addressing individual molecules with electrical leads in SMM-based spintronic devices remains a ubiquitous challenge: interactions with metallic electrodes can drastically modify the SMM’s properties by charge transfer or through changes in the molecular structure. Here, we probe electrical transport through individual Fe4 SMMs using a scanning tunnelling microscope at 0.5 K. Correlation of topographic and spectroscopic information permits identification of the spin excitation fingerprint of intact Fe4 molecules. Building from this, we find that the exchange coupling strength within the molecule’s magnetic core is significantly enhanced. First-principles calculations support the conclusion that this is the result of confinement of the molecule in the two-contact junction formed by the microscope tip and the sample surface.

Date: 2015
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DOI: 10.1038/ncomms9216

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