Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface

Hatem Labidi (), Mohammad Koleini (), Taleana Huff, Mark Salomons, Martin Cloutier, Jason Pitters and Robert A. Wolkow
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Hatem Labidi: University of Alberta
Mohammad Koleini: University of Alberta
Taleana Huff: University of Alberta
Mark Salomons: National Institute for Nanotechnology, National Research Council of Canada
Martin Cloutier: National Institute for Nanotechnology, National Research Council of Canada
Jason Pitters: National Institute for Nanotechnology, National Research Council of Canada
Robert A. Wolkow: University of Alberta

Nature Communications, 2017, vol. 8, issue 1, 1-7

Abstract: Abstract The origin of bond-resolved atomic force microscope images remains controversial. Moreover, most work to date has involved planar, conjugated hydrocarbon molecules on a metal substrate thereby limiting knowledge of the generality of findings made about the imaging mechanism. Here we report the study of a very different sample; a hydrogen-terminated silicon surface. A procedure to obtain a passivated hydrogen-functionalized tip is defined and evolution of atomic force microscopy images at different tip elevations are shown. At relatively large tip-sample distances, the topmost atoms appear as distinct protrusions. However, on decreasing the tip-sample distance, features consistent with the silicon covalent bonds of the surface emerge. Using a density functional tight-binding-based method to simulate atomic force microscopy images, we reproduce the experimental results. The role of the tip flexibility and the nature of bonds and false bond-like features are discussed.

Date: 2017
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DOI: 10.1038/ncomms14222

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