Three-dimensional surface topography of graphene by divergent beam electron diffraction

Tatiana Latychevskaia (), Wei-Hao Hsu, Wei-Tse Chang, Chun-Yueh Lin and Ing-Shouh Hwang ()
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Tatiana Latychevskaia: Physics Department of the University of Zurich
Wei-Hao Hsu: Institute of Physics, Academia Sinica
Wei-Tse Chang: Institute of Physics, Academia Sinica
Chun-Yueh Lin: Institute of Physics, Academia Sinica
Ing-Shouh Hwang: Institute of Physics, Academia Sinica

Nature Communications, 2017, vol. 8, issue 1, 1-7

Abstract: Abstract There are only a handful of scanning techniques that can provide surface topography at nanometre resolution. At the same time, there are no methods that are capable of non-invasive imaging of the three-dimensional surface topography of a thin free-standing crystalline material. Here we propose a new technique—the divergent beam electron diffraction (DBED) and show that it can directly image the inhomogeneity in the atomic positions in a crystal. Such inhomogeneities are directly transformed into the intensity contrast in the first-order diffraction spots of DBED patterns and the intensity contrast linearly depends on the wavelength of the employed probing electrons. Three-dimensional displacement of atoms as small as 1 angstrom can be detected when imaged with low-energy electrons (50–250 eV). The main advantage of DBED is that it allows visualization of the three-dimensional surface topography and strain distribution at the nanometre scale in non-scanning mode, from a single shot diffraction experiment.

Date: 2017
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DOI: 10.1038/ncomms14440

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