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Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films

Peng Gao (), Zhangyuan Zhang, Mingqiang Li, Ryo Ishikawa, Bin Feng, Heng-Jui Liu, Yen-Lin Huang, Naoya Shibata, Xiumei Ma, Shulin Chen, Jingmin Zhang, Kaihui Liu, En-Ge Wang, Dapeng Yu, Lei Liao (), Ying-Hao Chu and Yuichi Ikuhara ()
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Peng Gao: Electron Microscopy Laboratory, School of Physics, Peking University
Zhangyuan Zhang: Electron Microscopy Laboratory, School of Physics, Peking University
Mingqiang Li: Electron Microscopy Laboratory, School of Physics, Peking University
Ryo Ishikawa: Institute of Engineering Innovation, The University of Tokyo
Bin Feng: Institute of Engineering Innovation, The University of Tokyo
Heng-Jui Liu: National Chung Hsing University
Yen-Lin Huang: National Chiao Tung University
Naoya Shibata: Institute of Engineering Innovation, The University of Tokyo
Xiumei Ma: Electron Microscopy Laboratory, School of Physics, Peking University
Shulin Chen: Electron Microscopy Laboratory, School of Physics, Peking University
Jingmin Zhang: Electron Microscopy Laboratory, School of Physics, Peking University
Kaihui Liu: Collaborative Innovation Centre of Quantum Matter
En-Ge Wang: Collaborative Innovation Centre of Quantum Matter
Dapeng Yu: Electron Microscopy Laboratory, School of Physics, Peking University
Lei Liao: Wuhan University
Ying-Hao Chu: National Chiao Tung University
Yuichi Ikuhara: Institute of Engineering Innovation, The University of Tokyo

Nature Communications, 2017, vol. 8, issue 1, 1-8

Abstract: Abstract Although the size effect in ferroelectric thin films has been known for long time, the underlying mechanism is not yet fully understood and whether or not there is a critical thickness below which the ferroelectricity vanishes is still under debate. Here, we directly measure the thickness-dependent polarization in ultrathin PbZr0.2Ti0.8O3 films via quantitative annular bright field imaging. We find that the polarization is significantly suppressed for films

Date: 2017
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DOI: 10.1038/ncomms15549

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