Virtual substrate method for nanomaterials characterization

Bo Da (), Jiangwei Liu, Mahito Yamamoto, Yoshihiro Ueda, Kazuyuki Watanabe, Nguyen Thanh Cuong, Songlin Li, Kazuhito Tsukagoshi, Hideki Yoshikawa (), Hideo Iwai, Shigeo Tanuma (), Hongxuan Guo, Zhaoshun Gao, Xia Sun and Zejun Ding
Additional contact information
Bo Da: International Center for Young Scientists, National Institute for Materials Science
Jiangwei Liu: International Center for Young Scientists, National Institute for Materials Science
Mahito Yamamoto: International Center for Materials Nanoarchitectonics, National Institute for Materials Science
Yoshihiro Ueda: Tokyo University of Science
Kazuyuki Watanabe: Tokyo University of Science
Nguyen Thanh Cuong: International Center for Young Scientists, National Institute for Materials Science
Songlin Li: International Center for Materials Nanoarchitectonics, National Institute for Materials Science
Kazuhito Tsukagoshi: International Center for Materials Nanoarchitectonics, National Institute for Materials Science
Hideki Yoshikawa: Surface Chemical Analysis Group, Nano Characterization Unit, National Institute for Materials Science
Hideo Iwai: Surface Chemical Analysis Group, Nano Characterization Unit, National Institute for Materials Science
Shigeo Tanuma: Surface Chemical Analysis Group, Nano Characterization Unit, National Institute for Materials Science
Hongxuan Guo: Center for Nanoscale Science and Technology, National Institute of Standards and Technology
Zhaoshun Gao: National Institute for Materials Science
Xia Sun: University of Science and Technology of China
Zejun Ding: University of Science and Technology of China

Nature Communications, 2017, vol. 8, issue 1, 1-9

Abstract: Abstract Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflection-configuration techniques. Here, we propose a virtual substrate method, inspired by the four-point probe technique for resistance measurement as well as the chop-nod method in infrared astronomy, to characterize nanomaterials without the influence of underlying substrate signals from four interrelated measurements. By implementing this method in secondary electron (SE) microscopy, a SE spectrum (white electrons) associated with the reflectivity difference between two different substrates can be tracked and controlled. The SE spectrum is used to quantitatively investigate the covering nanomaterial based on subtle changes in the transmission of the nanomaterial with high efficiency rivalling that of conventional core-level electrons. The virtual substrate method represents a benchmark for surface analysis to provide ‘free-standing’ information about supported nanomaterials.

Date: 2017
References: Add references at CitEc
Citations:

Downloads: (external link)
https://www.nature.com/articles/ncomms15629 Abstract (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_ncomms15629

Ordering information: This journal article can be ordered from
https://www.nature.com/ncomms/

DOI: 10.1038/ncomms15629

Access Statistics for this article

Nature Communications is currently edited by Nathalie Le Bot, Enda Bergin and Fiona Gillespie

More articles in Nature Communications from Nature
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().