Electron ptychographic microscopy for three-dimensional imaging

Si Gao, Peng Wang (), Fucai Zhang (), Gerardo T. Martinez, Peter D. Nellist, Xiaoqing Pan and Angus I. Kirkland
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Si Gao: Nanjing University
Peng Wang: Nanjing University
Fucai Zhang: Southern University of Science and Technology
Gerardo T. Martinez: University of Oxford
Peter D. Nellist: University of Oxford
Xiaoqing Pan: Nanjing University
Angus I. Kirkland: University of Oxford

Nature Communications, 2017, vol. 8, issue 1, 1-8

Abstract: Abstract Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24–30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules.

Date: 2017
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DOI: 10.1038/s41467-017-00150-1

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