EconPapers    
Economics at your fingertips  
 

Dual-comb spectroscopic ellipsometry

Takeo Minamikawa (), Yi-Da Hsieh, Kyuki Shibuya, Eiji Hase, Yoshiki Kaneoka, Sho Okubo, Hajime Inaba, Yasuhiro Mizutani, Hirotsugu Yamamoto, Tetsuo Iwata and Takeshi Yasui
Additional contact information
Takeo Minamikawa: Tokushima University
Yi-Da Hsieh: Tokushima University
Kyuki Shibuya: Tokushima University
Eiji Hase: Tokushima University
Yoshiki Kaneoka: Tokushima University
Sho Okubo: ERATO Intelligent Optical Synthesizer (IOS) Project
Hajime Inaba: ERATO Intelligent Optical Synthesizer (IOS) Project
Yasuhiro Mizutani: ERATO Intelligent Optical Synthesizer (IOS) Project
Hirotsugu Yamamoto: ERATO Intelligent Optical Synthesizer (IOS) Project
Tetsuo Iwata: Tokushima University
Takeshi Yasui: Tokushima University

Nature Communications, 2017, vol. 8, issue 1, 1-8

Abstract: Abstract Spectroscopic ellipsometry is a means of investigating optical and dielectric material responses. Conventional spectroscopic ellipsometry is subject to trade-offs between spectral accuracy, resolution, and measurement time. Polarization modulation has afforded poor performance because of its sensitivity to mechanical vibrational noise, thermal instability, and polarization-wavelength dependency. We combine spectroscopic ellipsometry with dual-comb spectroscopy, namely, dual-comb spectroscopic ellipsometry. Dual-comb spectroscopic ellipsometry (DCSE). DCSE directly and simultaneously obtains the ellipsometric parameters of the amplitude ratio and phase difference between s-polarized and p-polarized light signals with ultra-high spectral resolution and no polarization modulation, beyond the conventional limit. Ellipsometric evaluation without polarization modulation also enhances the stability and robustness of the system. In this study, we construct a polarization-modulation-free DCSE system with a spectral resolution of up to 1.2 × 10−5 nm throughout the spectral range of 1514–1595 nm and achieved an accuracy of 38.4 nm and a precision of 3.3 nm in the measurement of thin-film samples.

Date: 2017
References: Add references at CitEc
Citations: View citations in EconPapers (1)

Downloads: (external link)
https://www.nature.com/articles/s41467-017-00709-y Abstract (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_s41467-017-00709-y

Ordering information: This journal article can be ordered from
https://www.nature.com/ncomms/

DOI: 10.1038/s41467-017-00709-y

Access Statistics for this article

Nature Communications is currently edited by Nathalie Le Bot, Enda Bergin and Fiona Gillespie

More articles in Nature Communications from Nature
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().

 
Page updated 2025-03-19
Handle: RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_s41467-017-00709-y