Electrically reversible cracks in an intermetallic film controlled by an electric field

Z. Q. Liu (), J. H. Liu, M. D. Biegalski, J.-M. Hu, S. L. Shang, Y. Ji, J. M. Wang, S. L. Hsu, A. T. Wong, M. J. Cordill, B. Gludovatz, C. Marker, H. Yan, Z. X. Feng, L. You, M. W. Lin, T. Z. Ward, Z. K. Liu, C. B. Jiang, L. Q. Chen, R. O. Ritchie, H. M. Christen and R. Ramesh
Additional contact information
Z. Q. Liu: Beihang University
J. H. Liu: Beihang University
M. D. Biegalski: Oak Ridge National Laboratory
J.-M. Hu: The Pennsylvania State University
S. L. Shang: The Pennsylvania State University
Y. Ji: The Pennsylvania State University
J. M. Wang: Beihang University
S. L. Hsu: University of California
A. T. Wong: Oak Ridge National Laboratory
M. J. Cordill: Montanuniversität Leoben
B. Gludovatz: UNSW Sydney
C. Marker: The Pennsylvania State University
H. Yan: Beihang University
Z. X. Feng: Beihang University
L. You: Huazhong University of Science and Technology
M. W. Lin: Oak Ridge National Laboratory
T. Z. Ward: Oak Ridge National Laboratory
Z. K. Liu: The Pennsylvania State University
C. B. Jiang: Beihang University
L. Q. Chen: The Pennsylvania State University
R. O. Ritchie: University of California
H. M. Christen: Oak Ridge National Laboratory
R. Ramesh: University of California

Nature Communications, 2018, vol. 9, issue 1, 1-7

Abstract: Abstract Cracks in solid-state materials are typically irreversible. Here we report electrically reversible opening and closing of nanoscale cracks in an intermetallic thin film grown on a ferroelectric substrate driven by a small electric field (~0.83 kV/cm). Accordingly, a nonvolatile colossal electroresistance on–off ratio of more than 108 is measured across the cracks in the intermetallic film at room temperature. Cracks are easily formed with low-frequency voltage cycling and remain stable when the device is operated at high frequency, which offers intriguing potential for next-generation high-frequency memory applications. Moreover, endurance testing demonstrates that the opening and closing of such cracks can reach over 107 cycles under 10-μs pulses, without catastrophic failure of the film.

Date: 2018
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DOI: 10.1038/s41467-017-02454-8

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