Fourier transform spectrometer on silicon with thermo-optic non-linearity and dispersion correction

Mario C. M. M. Souza, Andrew Grieco, Newton C. Frateschi and Yeshaiahu Fainman ()
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Mario C. M. M. Souza: University of Campinas
Andrew Grieco: University of California
Newton C. Frateschi: University of Campinas
Yeshaiahu Fainman: University of California

Nature Communications, 2018, vol. 9, issue 1, 1-8

Abstract: Abstract Miniaturized integrated spectrometers will have unprecedented impact on applications ranging from unmanned aerial vehicles to mobile phones, and silicon photonics promises to deliver compact, cost-effective devices. Mirroring its ubiquitous free-space counterpart, a silicon photonics-based Fourier transform spectrometer (Si-FTS) can bring broadband operation and fine resolution to the chip scale. Here we present the modeling and experimental demonstration of a thermally tuned Si-FTS accounting for dispersion, thermo-optic non-linearity, and thermal expansion. We show how these effects modify the relation between the spectrum and interferogram of a light source and we develop a quantitative correction procedure through calibration with a tunable laser. We retrieve a broadband spectrum (7 THz around 193.4 THz with 0.38-THz resolution consuming 2.5 W per heater) and demonstrate the Si-FTS resilience to fabrication variations—a major advantage for large-scale manufacturing. Providing design flexibility and robustness, the Si-FTS is poised to become a fundamental building block for on-chip spectroscopy.

Date: 2018
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DOI: 10.1038/s41467-018-03004-6

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