Degradation of blue-phosphorescent organic light-emitting devices involves exciton-induced generation of polaron pair within emitting layers

Sinheui Kim, Hye Jin Bae, Sangho Park, Wook Kim, Joonghyuk Kim, Jong Soo Kim, Yongsik Jung, Soohwan Sul, Soo-Ghang Ihn (), Changho Noh, Sunghan Kim () and Youngmin You ()
Additional contact information
Sinheui Kim: Ewha Womans University
Hye Jin Bae: Samsung Electronics Co., Ltd.
Sangho Park: Samsung Electronics Co., Ltd.
Wook Kim: Samsung SDI Co., Ltd.
Joonghyuk Kim: Samsung Electronics Co., Ltd.
Jong Soo Kim: Samsung Electronics Co., Ltd.
Yongsik Jung: Samsung Electronics Co., Ltd.
Soohwan Sul: Samsung Electronics Co., Ltd.
Soo-Ghang Ihn: Samsung Electronics Co., Ltd.
Changho Noh: Samsung Electronics Co., Ltd.
Sunghan Kim: Samsung Electronics Co., Ltd.
Youngmin You: Ewha Womans University

Nature Communications, 2018, vol. 9, issue 1, 1-11

Abstract: Abstract Degradation of organic materials is responsible for the short operation lifetimes of organic light-emitting devices, but the mechanism by which such degradation is initiated has yet to be fully established. Here we report a new mechanism for degradation of emitting layers in blue-phosphorescent devices. We investigate binary mixtures of a wide bandgap host and a series of novel Ir(III) complex dopants having N-heterocyclocarbenic ligands. Our mechanistic study reveals the charge-neutral generation of polaron pairs (radical ion pairs) by electron transfer from the dopant to host excitons. Annihilation of the radical ion pair occurs by charge recombination, with such annihilation competing with bond scission. Device lifetime correlates linearly with the rate constant for the annihilation of the radical ion pair. Our findings demonstrate the importance of controlling exciton-induced electron transfer, and provide novel strategies to design materials for long-lifetime blue electrophosphorescence devices.

Date: 2018
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DOI: 10.1038/s41467-018-03602-4

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