Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode

Haomin Wang, Le Wang, Devon S. Jakob and Xiaoji G. Xu ()
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Haomin Wang: Lehigh University
Le Wang: Lehigh University
Devon S. Jakob: Lehigh University
Xiaoji G. Xu: Lehigh University

Nature Communications, 2018, vol. 9, issue 1, 1-11

Abstract: Abstract Scattering-type scanning near-field optical microscopy (s-SNOM) enables nanoscale spectroscopic imaging and has been instrumental for many nano-photonic discoveries and in situ studies. However, conventional s-SNOM techniques with atomic force microscopy tapping mode operation and lock-in detections do not provide direct tomographic information with explicit tip−sample distance. Here, we present a non-traditional s-SNOM technique, named peak force scattering-type scanning near-field optical microscopy (PF-SNOM), by combination of peak force tapping mode and time-gated light detection. PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. Tip-induced relaxation of surface phonon polaritons are revealed and modeled by considering tip damping. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals. PF-SNOM is expected to facilitate three-dimensional nanoscale near-field characterizations and correlative in situ investigations on light-induced mechanical and electrical effects.

Date: 2018
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DOI: 10.1038/s41467-018-04403-5

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