Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

Kevin Vynck (), Nicholas J. Dinsdale, Bigeng Chen, Roman Bruck, Ali Z. Khokhar, Scott A. Reynolds, Lee Crudgington, David J. Thomson, Graham T. Reed, Philippe Lalanne and Otto L. Muskens ()
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Kevin Vynck: CNRS-Institut d’Optique Graduate School-Univ. Bordeaux
Nicholas J. Dinsdale: University of Southampton
Bigeng Chen: University of Southampton
Roman Bruck: University of Southampton
Ali Z. Khokhar: University of Southampton
Scott A. Reynolds: University of Southampton
Lee Crudgington: University of Southampton
David J. Thomson: University of Southampton
Graham T. Reed: University of Southampton
Philippe Lalanne: CNRS-Institut d’Optique Graduate School-Univ. Bordeaux
Otto L. Muskens: University of Southampton

Nature Communications, 2018, vol. 9, issue 1, 1-10

Abstract: Abstract Advanced photonic probing techniques are of great importance for the development of non-contact wafer-scale testing of photonic chips. Ultrafast photomodulation has been identified as a powerful new tool capable of remotely mapping photonic devices through a scanning perturbation. Here, we develop photomodulation maps into a quantitative technique through a general and rigorous method based on Lorentz reciprocity that allows the prediction of transmittance perturbation maps for arbitrary linear photonic systems with great accuracy and minimal computational cost. Excellent agreement is obtained between predicted and experimental maps of various optical multimode-interference devices, thereby allowing direct comparison of a device under test with a physical model of an ideal design structure. In addition to constituting a promising route for optical testing in photonics manufacturing, ultrafast perturbation mapping may be used for design optimization of photonic structures with reconfigurable functionalities.

Date: 2018
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DOI: 10.1038/s41467-018-04662-2

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