Impact ionization by hot carriers in a black phosphorus field effect transistor
Faisal Ahmed,
Young Duck Kim,
Zheng Yang,
Pan He,
Euyheon Hwang,
Hyunsoo Yang,
James Hone and
Won Jong Yoo ()
Additional contact information
Faisal Ahmed: Sungkyunkwan University
Young Duck Kim: Columbia University
Zheng Yang: Sungkyunkwan University
Pan He: National University of Singapore
Euyheon Hwang: Sungkyunkwan University
Hyunsoo Yang: National University of Singapore
James Hone: Columbia University
Won Jong Yoo: Sungkyunkwan University
Nature Communications, 2018, vol. 9, issue 1, 1-7
Abstract:
Abstract The strong Coulombic interactions in miniaturized structures can lead to efficient carrier multiplication, which is essential for many-body physics and design of efficient photonic devices beyond thermodynamic conversion limits. However, carrier multiplication has rarely been realized in layered semiconducting materials despite strong electronic interactions. Here, we report the experimental observation of unusual carrier multiplication in a multilayer black phosphorus device. Electric field-dependent Hall measurements confirm a substantial increase of carrier density in multilayer black phosphorus channel, which is attributed to the impact ionization by energetic carriers. This mechanism relies on the generation of self-heating induced charge carriers under the large electric field due to competition between electron–electron and electron–phonon interactions in the direct and narrow band gap (0.3 eV) of the multilayer black phosphorus. These findings point the way toward utilization of carrier multiplication to enhance the performance of electronics and optoelectronics devices based on two-dimensional materials.
Date: 2018
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Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:9:y:2018:i:1:d:10.1038_s41467-018-05981-0
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DOI: 10.1038/s41467-018-05981-0
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