Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing

A F J van Raan and J G M van der Velde

Research Evaluation, 1992, vol. 2, issue 2, 103-110

Abstract: An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). Copyright , Beech Tree Publishing.

Date: 1992
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