Using Neural Network Analysis to Uncover the Trace Effects of National Culture
John F Veiga,
Michael Lubatkin,
Roland Calori,
Phillipe Very and
Y Alex Tung
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John F Veiga: University of Connecticut
Michael Lubatkin: University of Connecticut and Groupe ESC Lyon
Roland Calori: Groupe ESC Lyon
Phillipe Very: Groupe ESC Lyon
Y Alex Tung: University of Connecticut
Journal of International Business Studies, 2000, vol. 31, issue 2, 223-238
Abstract:
The primary objective of this paper is to demonstrate the usefulness of an artificial intelligence technique known as neural network analysis as an aid to uncovering the underlying patterns, or trace effects, of national culture. To make our case, we provide an application of the technique's pattern recognition capability utilizing survey data from top executives in French and British firms. We conclude by interpreting the trace effects found and encouraging the use of this tool by cross-cultural researchers in the future.© 2000 JIBS. Journal of International Business Studies (2000) 31, 223–238
Date: 2000
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Persistent link: https://EconPapers.repec.org/RePEc:pal:jintbs:v:31:y:2000:i:2:p:223-238
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