Economic optimization of off-line inspection with inspection errors
S H Sheu (),
Y C Chen,
W Y Wang and
N H Shin
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S H Sheu: National Taiwan University of Science & Technology
Y C Chen: National Taiwan University of Science & Technology
W Y Wang: Tung Nan Institute of Technology
N H Shin: National Pingtung Institute of Commerce
Journal of the Operational Research Society, 2003, vol. 54, issue 8, 888-895
Abstract:
Abstract In this paper, we find the optimal inspection policy for the production process of a finite batch of items with inspection errors. We study the effects of inspection errors on the optimal solution and determine which unit should be inspected to minimize the expected total costs. We also find the expected number of inspections for a given batch size. Comparisons of total costs are investigated numerically among the cost minimizing policy, the policy of perfect information, and the policy of zero-defects.
Keywords: quality control; optimization; off-line inspection; inspection errors (search for similar items in EconPapers)
Date: 2003
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Citations: View citations in EconPapers (3)
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Persistent link: https://EconPapers.repec.org/RePEc:pal:jorsoc:v:54:y:2003:i:8:d:10.1057_palgrave.jors.2601582
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DOI: 10.1057/palgrave.jors.2601582
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