Economical sampling plans with warranty based on truncated data from Burr type XII distribution

Tzong-Ru Tsai, Yuhlong Lio, Nan Jiang, Yu-Jau Lin and Ya-Yen Fan
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Tzong-Ru Tsai: Tamkang University, New Taipei City, Taiwan
Yuhlong Lio: University of South Dakota, Vermillion, USA
Nan Jiang: University of South Dakota, Vermillion, USA
Yu-Jau Lin: Chung Yuan Christian University, Chung Li City, Taiwan
Ya-Yen Fan: Tamkang University, New Taipei City, Taiwan

Journal of the Operational Research Society, 2015, vol. 66, issue 9, 1511-1518

Abstract: Economical sampling plans to ensure the qualities of Burr type XII distributed lifetimes were established using a truncated life test. The Bayesian inference method was used to address the lot-to-lot variation of products. The sampling plan was characterized by the sample size and the acceptance number to minimize the expected total cost. A simple empirical Bayesian estimation method was provided to estimate the hyperparameters of prior distribution, and simulation studies were conducted to validate the proposed empirical Bayesian estimation method. Lastly, the application of this proposed method was illustrated using two examples.

Date: 2015
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