EconPapers    
Economics at your fingertips  
 

Global Market Conditions and Systemic Risk

Brenda González-Hermosillo and Heiko Hesse
Additional contact information
Brenda González-Hermosillo: Visiting Professor of Finance, Sloan School of Management, Massachusetts Institute of Technology, 100 Main Street, E62-612, Cambridge, MA 02142. E-mail: bgh@mit.edu

Journal of Emerging Market Finance, 2011, vol. 10, issue 2, 227-252

Abstract: This article examines several key global market conditions, such as a proxy for market uncertainty and measures of interbank funding stress, to assess financial volatility and the likelihood of crisis. Using Markov regime-switching techniques, it shows that the Lehman Brothers failure was a watershed event in the crisis, although signs of heightened systemic risk could be detected as early as February 2007. In addition, we analyse the role of global market conditions to help determine when governments should begin to exit their extraordinary public support measures.

Keywords: JEL Classification: C32; JEL Classification: E44; JEL Classification: G12; Systemic risk; global financial crises; emerging markets; subprime crisis; volatility; solvency; Markov regime-switching techniques (search for similar items in EconPapers)
Date: 2011
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (10)

Downloads: (external link)
https://journals.sagepub.com/doi/10.1177/097265271101000204 (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:sae:emffin:v:10:y:2011:i:2:p:227-252

DOI: 10.1177/097265271101000204

Access Statistics for this article

More articles in Journal of Emerging Market Finance from Institute for Financial Management and Research
Bibliographic data for series maintained by SAGE Publications ().

 
Page updated 2025-03-31
Handle: RePEc:sae:emffin:v:10:y:2011:i:2:p:227-252