SkSP-V sampling plan for accelerated life tests

Muhammad Aslam, Chi-Hyuck Jun and Ashifa Arshad

Journal of Risk and Reliability, 2015, vol. 229, issue 3, 193-199

Abstract: Here, we will develop a time-truncated skip-lot sampling plan (type V) for an accelerated life test. The lifetime of a product under the accelerated condition follows a Weibull distribution having the same shape parameter under the use condition but a new scale parameter adjusted by the acceleration factor. The plan parameters for the proposed sampling plan were found by satisfying the producer’s and the consumer’s risks. The performance of the proposed plan is compared with the existing single sampling plan for accelerated life testing. The proposed plan is more efficient than the existing plan in terms of the average sample number. The extensive tables are provided for the proposed plan so that industrial engineers can use the plan in practice.

Keywords: Accelerated life testing; sampling plan; average sample number; consumer’s risk; producer’s risk (search for similar items in EconPapers)
Date: 2015
References: View references in EconPapers View complete reference list from CitEc
Citations:

Downloads: (external link)
https://journals.sagepub.com/doi/10.1177/1748006X15572499 (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:sae:risrel:v:229:y:2015:i:3:p:193-199

DOI: 10.1177/1748006X15572499

Access Statistics for this article

More articles in Journal of Risk and Reliability
Bibliographic data for series maintained by SAGE Publications ().