Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints

Narayanaswamy Balakrishnan and Elena Castilla

Journal of Risk and Reliability, 2025, vol. 239, issue 5, 900-914

Abstract: We introduce here a new family of divergence-based estimators in this work for predicting the lifetimes of one-shot devices subjected to cyclic Accelerated Life-Tests (ALTs). This family, which includes the maximum likelihood estimator (MLE) as a special case, offers a robust alternative to traditional inferential procedures. We also present a family of divergence-based model selection criteria. A simulation study and a numerical example illustrate the advantages of these estimators and the robust inferential methods based on them.

Keywords: Cyclic accelerated life-tests; density power divergences; model selection; one-shot devices; robustness (search for similar items in EconPapers)
Date: 2025
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Persistent link: https://EconPapers.repec.org/RePEc:sae:risrel:v:239:y:2025:i:5:p:900-914

DOI: 10.1177/1748006X251314506

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