Detection of multivariate outliers with location slippage or scale inflation in left orthogonally invariant or elliptically contoured distributions

Takahiko Hara

Annals of the Institute of Statistical Mathematics, 1988, vol. 40, issue 2, 395-406

Keywords: Left orthogonally invariant; elliptically contoured; null robust; maximal invariant; Wijsman's representation theorem; UBIS decision rule (search for similar items in EconPapers)
Date: 1988
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DOI: 10.1007/BF00052353

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