Bivariate Sign Tests Based on the Sup, L 1 and L 2 Norms

Denis Larocque, Serge Tardif and Constance van Eeden

Annals of the Institute of Statistical Mathematics, 2000, vol. 52, issue 3, 488-506

Keywords: Location problem; distribution-free; affine-invariance; normal process; Wiener process; L 1 -norm; L 2 -norm; Hodges' test; Blumen's test (search for similar items in EconPapers)
Date: 2000
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DOI: 10.1023/A:1004121503274

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