An adaptive lot-traceability sampling plan for Weibull distributed lifetime with warranty return rate consideration and a smart information system

Chien-Wei Wu, Ming-Hung Shu and To-Cheng Wang ()
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Chien-Wei Wu: National Tsing Hua University
Ming-Hung Shu: National Kaohsiung University of Science and Technology
To-Cheng Wang: National Kaohsiung University of Science and Technology

Annals of Operations Research, 2025, vol. 349, issue 1, No 6, 87-101

Abstract: Abstract In today's highly competitive market, product warranty is a critical tool that companies use to showcase their product quality and reliability. Companies need to verify and validate product lifetimes to control warranty costs and maintain brand reputation. The reliability acceptance sampling plan is a practical tool for practitioners to validate product lifetimes and determine lot disposition. However, the traditional plan's efficiency decreases as more historical reliability information is included in the decision rule. This paper introduces an adaptive lot-traceability sampling plan (ALSP) that overcomes this limitation by employing a more flexible lot-traceability mechanism. The proposed ALSP can sustainably increase efficiency by accommodating more historical reliability information, resulting in significantly reduced product failures required for life testing. Furthermore, it has superior discriminating power regarding the degradation of lot reliability compared to the existing plan. We also provide an interactive user interface in the form of a smart information system to guide practitioners in designing optimal plans easily. Finally, we illustrate the applicability of the proposed ALSP in an industrial case study.

Keywords: Smart information system; Historical reliability information; Optimal system design; Adaptive-lot-traceability sampling plan; Warranty (search for similar items in EconPapers)
Date: 2025
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DOI: 10.1007/s10479-023-05438-8

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