Patents, R&D and lag effects: evidence from flexible methods for count panel data on manufacturing firms

Shiferaw Gurmu and Fidel Pérez-Sebastián
Authors registered in the RePEc Author Service: Fidel Perez Sebastian

Empirical Economics, 2008, vol. 35, issue 3, 507-526

Keywords: Innovative activity; Patents and R&D; Individual effects; Count panel data methods; C20; O30 (search for similar items in EconPapers)
Date: 2008
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (24)

Downloads: (external link)
http://hdl.handle.net/10.1007/s00181-007-0176-8 (text/html)
Access to full text is restricted to subscribers.

Related works:
Working Paper: PATENTS, R&D AND LAG EFFECTS: EVIDENCE FROM FLEXIBLE METHODS FOR COUNT PANEL DATA ON MANUFACTURING FIRMS (2007)
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:empeco:v:35:y:2008:i:3:p:507-526

Ordering information: This journal article can be ordered from
http://www.springer. ... rics/journal/181/PS2

DOI: 10.1007/s00181-007-0176-8

Access Statistics for this article

Empirical Economics is currently edited by Robert M. Kunst, Arthur H.O. van Soest, Bertrand Candelon, Subal C. Kumbhakar and Joakim Westerlund

More articles in Empirical Economics from Springer
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().