Excess thermal-noise in the electrical breakdown of random resistor networks

C. Pennetta, L.B. Kiss, Z. Gingl and L. Reggiani

The European Physical Journal B: Condensed Matter and Complex Systems, 1999, vol. 12, issue 1, 61-65

Keywords: PACS. 72.70.+m Noise processes and phenomena[:AND:]73.61.-r Electrical properties of specific thin films and layer structures; (multilayers; superlattices; quantum wells; wires; and dots) - 81.70.Cv Nondestructive testing: ultrasonic testing; photoacoustic testing (search for similar items in EconPapers)
Date: 1999
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DOI: 10.1007/s100510050977

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