A wavelet-based method for multifractal image analysis. I. Methodology and test applications on isotropic and anisotropic random rough surfaces

A. Arnéodo, N. Decoster and S.G. Roux

The European Physical Journal B: Condensed Matter and Complex Systems, 2000, vol. 15, issue 3, 567-600

Keywords: PACS. 47.53.+n Fractals - 02.50.-r Probability theory; stochastic processes; and statistics; 05.40.-a Fluctuation phenomena; random processes; noise; and Brownian motion; 68.35.Bs Surface structure and topography (search for similar items in EconPapers)
Date: 2000
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DOI: 10.1007/s100510051161

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