Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction

V. Chamard, C. Pichat and G. Dolino

The European Physical Journal B: Condensed Matter and Complex Systems, 2001, vol. 21, issue 2, 185-190

Keywords: PACS. 61.10.Eq X-ray scattering (including small-angle scattering); 68.55.-a Thin film structure and morphology; 81.07.-b Nanoscale materials and structures: fabrication and characterization; 68.55.Ac Nucleation and growth: microscopic aspects (search for similar items in EconPapers)
Date: 2001
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DOI: 10.1007/s100510170194

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