Magnetic texturing of xenon-ion irradiated nickel films

K. Zhang, K. Lieb (), G. Müller, P. Schaaf, M. Uhrmacher and M. Münzenberg

The European Physical Journal B: Condensed Matter and Complex Systems, 2004, vol. 42, issue 2, 193-204

Abstract: Thin polycrystalline Ni films of typically 75 nm thickness evaporated on Si or SiO 2 substrates were irradiated with 30-900 keV Xe-ions to fluences of 2.5 x 10 13 - 4 x 10 14 /cm 2 . The magnetization of the Ni films was measured using the longitudinal Magneto-Optical Kerr Effect and Vibrating Sample Magnetometry. The Ni-film thickness and Xe-concentration profiles were determined with Rutherford backscattering spectroscopy and the lattice dilation with X-ray diffraction. The Xe-irradiations were found to induce an in-plane uniaxial magnetic anisotropy within the Ni-films. This magnetic texture was investigated in relationship to the microstructure as function of the ion energy and fluence, the sample temperature, the presence of an external magnetic field during the irradiation and the stress field produced before, during and after the implantations. Copyright Springer-Verlag Berlin/Heidelberg 2004

Date: 2004
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://hdl.handle.net/10.1140/epjb/e2004-00372-9 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:eurphb:v:42:y:2004:i:2:p:193-204

Ordering information: This journal article can be ordered from
http://www.springer.com/economics/journal/10051

DOI: 10.1140/epjb/e2004-00372-9

Access Statistics for this article

The European Physical Journal B: Condensed Matter and Complex Systems is currently edited by P. Hänggi and Angel Rubio

More articles in The European Physical Journal B: Condensed Matter and Complex Systems from Springer, EDP Sciences
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().