Diffraction study of the piezoelectric properties of low quartz

R. Guillot, P. Fertey (), N. Hansen, P. Allé, E. Elkaím and C. Lecomte

The European Physical Journal B: Condensed Matter and Complex Systems, 2004, vol. 42, issue 3, 373-380

Abstract: The effect of a static electric field on the crystal structure of $\alpha $ -quartz has been determined by Xray diffraction on single crystals. By a stroboscopic technique rocking curves are measured quasi simultaneously for zero field and for two opposite strong fields (28.8 kV/cm) applied in the direction of the crystallographic a-axis. The relative intensity-changes of high order reflections (i.e. sensitive to the core electrons) were measured and analysed by a least squares method technique. The analysis indicates that the bond distances Si-O are very little affected by the field, but both a deformation and a reorientation of the SiO 4 tetrahedra are induced. The model is qualitatively in agreement with the small amplitudes of the induced polarisation and the piezoelectric coefficients. Copyright Springer-Verlag Berlin/Heidelberg 2004

Date: 2004
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DOI: 10.1140/epjb/e2004-00393-4

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