A simple method for the determination of strains in epitaxial films: application to Eu(110) deposited on a Nb(110) buffer

S. Soriano, T. Gourieux, A. Stunault, K. Dumesnil and C. Dufour ()

The European Physical Journal B: Condensed Matter and Complex Systems, 2005, vol. 48, issue 2, 167-171

Abstract: In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

Date: 2005
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DOI: 10.1140/epjb/e2005-00400-4

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