Raman measurements on thin films of the La 0.7 Sr 0.3 MnO 3 manganite: a probe of substrate-induced effects

P. Dore (), P. Postorino, A. Sacchetti, M. Baldini, R. Giambelluca, M. Angeloni and G. Balestrino

The European Physical Journal B: Condensed Matter and Complex Systems, 2005, vol. 48, issue 2, 255-258

Abstract: We report on a Raman study of the phonon spectrum of La 0.7 Sr 0.3 MnO 3 thin films epitaxially grown on LaAlO 3 . The spectrum, as a function of film thickness d, does not change over the 1000–100 Å range, whereas a strong hardening of the phonon frequencies of both bending and stretching modes is apparent in ultra-thin films (d>100 Å) where substrate-induced effects are remarkable. This behaviour, which appears to be related with the measured d-dependence of the insulator-to-metal transition temperature, is ascribed to co-operative effects of MnO 6 octahedra rotation and charge-localization. Raman spectroscopy proves to be a simple and powerful tool to monitor subtle structural modifications hardly detectable with conventional diffraction techniques in ultra-thin films. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

Date: 2005
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DOI: 10.1140/epjb/e2005-00401-3

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