X-ray photoelectron diffraction study of ultrathin PbTiO 3 films

L. Despont (), C. Lichtensteiger, F. Clerc, M. G. Garnier, F.J. Garcia de Abajo, M. A. Van Hove, J.-M. Triscone and P. Aebi

The European Physical Journal B: Condensed Matter and Complex Systems, 2006, vol. 49, issue 2, 141-146

Abstract: Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO 3 (PTO) films grown on Nb-doped SrTiO 3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B $\textbf{63}$ , 075404 (2001)] is used to simulate the experiments. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2006

Date: 2006
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://hdl.handle.net/10.1140/epjb/e2006-00050-0 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:eurphb:v:49:y:2006:i:2:p:141-146

Ordering information: This journal article can be ordered from
http://www.springer.com/economics/journal/10051

DOI: 10.1140/epjb/e2006-00050-0

Access Statistics for this article

The European Physical Journal B: Condensed Matter and Complex Systems is currently edited by P. Hänggi and Angel Rubio

More articles in The European Physical Journal B: Condensed Matter and Complex Systems from Springer, EDP Sciences
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().