Fine structure effects and phase transition of Xe nanocrystals in Si

G. Faraci (), A. R. Pennisi and F. Zontone

The European Physical Journal B: Condensed Matter and Complex Systems, 2006, vol. 51, issue 2, 209-213

Abstract: We report on an X-ray diffraction study performed on Xe agglomerates obtained by ion implantation in a Si matrix. At low temperature, Xe nano-crystals were formed in Si with different average sizes according to the preparation procedure. High resolution diffraction spectra were detected as a function of the temperature, in the range 15–300 K, showing evidence of fine structure effects in the growth mode of the Xe nanocrystals. We report the first experimental observation of fcc crystalline agglomerates with a lattice parameter expanded by the epitaxial condensation on the Si cavities, whereas for small agglomerates randomly oriented evidence of a contracted lattice was found. For these nanocrystals, a solid-to-liquid transition temperature, size dependent, was detected; above the transition temperature, a fluid phase was observed. Neither overpressurized clusters were detected at any temperature, nor preferential binary size distribution as reported for a metal matrix. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2006

Keywords: 61.10.Nz X-ray diffraction; 61.46.-w Nanoscale materials; 81.07.Ta Quantum dots (search for similar items in EconPapers)
Date: 2006
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DOI: 10.1140/epjb/e2006-00214-x

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